IC Handlers | Aetrium

V6 IC TEST HANDLER

Aetrium’s Model V6 IC Test Handler is ideally suited for high production volume handling of a variety of integrated circuits using tube input and output media. The small footprint handler is capable of handling a wide variety of packages including SOIC, SSOP, TSSOP, QSOP, PLCC, TO220 and many other new leadless QFN type packages.

High Speed Indexing with Unique Test Site Actuators

  • Up to 10,500 UPH includes up to 350 ms of test time
  • Single, parallel, ping-pong or asynchronous operation
  • 60mm test site pitch optional (dual site)

Flexible Configuration

  • Test Sites
    • Single
    • Dual
    • Split Kit
  • Temperatures
    • Ambient
    • Ambient-Hot (cold ready)
    • Tri-Temp (ambient, hot and cold)
  • Input / Output Media
    • Tube
  • Any size test head
  • GUI with Touch-screen LCD monitor

Device Handling

  • Front-access Input Auto Loader
  • Front-access Output Auto Unloader
  • Contacting
    • Kelvin
    • Standard (non-kelvin)
    • Plunge-to-trace
    • Customer supplied
    • Third party
  • Adaptable to a complete spectrum of tests (RF, digital and analog)
  • Tool-less access portals for jam clearance
  • 3 pair of programmable outputs (6 total)
  • Error proofing – minimize PPM

Mechanical Refrigeration (on-board)

  • No LN2 tanks or plumbing required

V6